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Proceedings of the European Test Workshop
Publication Venue For
Design of fault-Tolerant neuromorphic computing systems
2018
A design-for-test solution for monolithic 3D integrated circuits
2016
Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing
2016
Two-dimensional time-division multiplexing for 3D-SoCs
2016
Yield analysis for repairable embedded memories
2003
