Compressive single-pixel snapshot x-ray diffraction imaging


Journal Article

We present a method for realizing snapshot, depth-resolved material identification using only a single, energysensitive pixel. To achieve this result, we employ a coded aperture with subpixel features to modulate the energy spectrum of coherently scattered photons and recover the object properties using an iterative inversion algorithm based on compressed sensing theory. We demonstrate high-fidelity object estimation at x-ray wavelengths for a variety of compression ratios exceeding unity. © 2013 Optical Society of America.

Full Text

Duke Authors

Cited Authors

  • Greenberg, J; Krishnamurthy, K; Brady, D

Published Date

  • January 1, 2014

Published In

Volume / Issue

  • 39 / 1

Start / End Page

  • 111 - 114

Electronic International Standard Serial Number (EISSN)

  • 1539-4794

International Standard Serial Number (ISSN)

  • 0146-9592

Digital Object Identifier (DOI)

  • 10.1364/OL.39.000111

Citation Source

  • Scopus