Measurement system for the high-throughput characterization of metal nanoparticles for biosensors

Journal Article

We present a system for the rapid characterization of nanoparticles for biosensors, providing concurrent atomic force microscopy and scattering spectra of individual nanoparticles and simultaneous spectra from various nanostructures created by electron beam lithography © 2005 Optical Society of America.

Duke Authors

Cited Authors

  • Curry, A; Nusz, G; Chilkoti, A; Wax, A

Published Date

  • January 1, 2006

Published In

Electronic International Standard Serial Number (EISSN)

  • 2162-2701

Citation Source

  • Scopus