Measurement system for the high-throughput characterization of metal nanoparticles for biosensors
We present a system for the rapid characterization of nanoparticles for biosensors, providing concurrent atomic force microscopy and scattering spectra of individual nanoparticles and simultaneous spectra from various nanostructures created by electron beam lithography © 2005 Optical Society of America.
- Curry, A; Nusz, G; Chilkoti, A; Wax, A
- January 1, 2006
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