Structured illumination diffraction phase microscopy for broadband, subdiffraction resolution, quantitative phase imaging.


Journal Article

Structured illumination microscopy (SIM) is an established technique that allows subdiffraction resolution imaging by heterodyning high sample frequencies into the system's passband via structured illumination. However, until now, SIM has been typically used to achieve subdiffraction resolution for intensity-based imaging. Here, we present a novel optical setup that uses structured illumination with a broadband light source to obtain noise-reduced, subdiffraction resolution, quantitative phase imaging (QPM) of cells. We compare this with a previous work for subdiffraction QPM imaging via SIM that used a laser source, and was thus still corrupted by coherent noise.

Full Text

Duke Authors

Cited Authors

  • Chowdhury, S; Izatt, J

Published Date

  • February 2014

Published In

Volume / Issue

  • 39 / 4

Start / End Page

  • 1015 - 1018

PubMed ID

  • 24562266

Pubmed Central ID

  • 24562266

Electronic International Standard Serial Number (EISSN)

  • 1539-4794

International Standard Serial Number (ISSN)

  • 0146-9592

Digital Object Identifier (DOI)

  • 10.1364/ol.39.001015


  • eng