Determining thickness independently from optical constants using ultrafast spectral interferometry

Journal Article

We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.

Duke Authors

Cited Authors

  • Huang, F; Federici, JF; Gary, D; Jedju, T; Warren, WS

Published Date

  • December 1, 2005

Published In

  • 2005 Conference on Lasers and Electro-Optics, CLEO

Volume / Issue

  • 2 /

Start / End Page

  • 1103 - 1105

Citation Source

  • Scopus