Determining thickness independently from optical constants using ultrafast spectral interferometry
Published
Journal Article
We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.
Duke Authors
Cited Authors
- Huang, F; Federici, JF; Gary, D; Jedju, T; Warren, WS
Published Date
- December 1, 2005
Published In
- 2005 Conference on Lasers and Electro Optics, Cleo
Volume / Issue
- 2 /
Start / End Page
- 1103 - 1105
Citation Source
- Scopus