Determining thickness independently from optical constants using ultrafast spectral interferometry
Publication
, Journal Article
Huang, F; Federici, JF; Gary, D; Jedju, T; Warren, WS
Published in: 2005 Conference on Lasers and Electro-Optics, CLEO
December 1, 2005
We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.
Duke Scholars
Published In
2005 Conference on Lasers and Electro-Optics, CLEO
Publication Date
December 1, 2005
Volume
2
Start / End Page
1103 / 1105
Citation
APA
Chicago
ICMJE
MLA
NLM
Huang, F., Federici, J. F., Gary, D., Jedju, T., & Warren, W. S. (2005). Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro-Optics, CLEO, 2, 1103–1105.
Huang, F., J. F. Federici, D. Gary, T. Jedju, and W. S. Warren. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” 2005 Conference on Lasers and Electro-Optics, CLEO 2 (December 1, 2005): 1103–5.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro-Optics, CLEO. 2005 Dec 1;2:1103–5.
Huang, F., et al. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” 2005 Conference on Lasers and Electro-Optics, CLEO, vol. 2, Dec. 2005, pp. 1103–05.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro-Optics, CLEO. 2005 Dec 1;2:1103–1105.
Published In
2005 Conference on Lasers and Electro-Optics, CLEO
Publication Date
December 1, 2005
Volume
2
Start / End Page
1103 / 1105