The Physics of the B Factories

Journal Article (Review;Journal)

Full Text

Duke Authors

Cited Authors

  • Bevan, AJ; Golob, B; Mannel, T; Prell, S; Yabsley, BD; Aihara, H; Anulli, F; Arnaud, N; Aushev, T; Beneke, M; Beringer, J; Bianchi, F; Bigi, II; Bona, M; Brambilla, N; Brodzicka, J; Chang, P; Charles, MJ; Cheng, CH; Cheng, HY; Chistov, R; Colangelo, P; Coleman, JP; Drutskoy, A; Druzhinin, VP; Eidelman, S; Eigen, G; Eisner, AM; Faccini, R; Flood, KT; Gambino, P; Gaz, A; Gradl, W; Hayashii, H; Higuchi, T; Hulsbergen, WD; Hurth, T; Iijima, T; Itoh, R; Jackson, PD; Kass, R; Kolomensky, YG; Kou, E; Kri┼żan, P; Kronfeld, A; Kumano, S; Kwon, YJ; Latham, TE; Leith, DWGS; Lüth, V; Martinez-Vidal, F; Meadows, BT; Mussa, R; Nakao, M; Nishida, S; Ocariz, J; Olsen, SL; Pakhlov, P; Pakhlova, G; Palano, A; Pich, A; Playfer, S; Poluektov, A; Porter, FC; Robertson, SH; Roney, JM; Roodman, A; Sakai, Y; Schwanda, C; Schwartz, AJ; Seidl, R; Sekula, SJ; Steinhauser, M; Sumisawa, K; Swanson, ES; Tackmann, F; Trabelsi, K; Uehara, S; Uno, S; van de Water, R; Vasseur, G; Verkerke, W; Waldi, R; Wang, MZ; Wilson, FF; Zupan, J; Zupanc, A; Adachi, I; Albert, J; Banerjee, S; Bellis, M; Ben-Haim, E; Biassoni, P; Cahn, RN; Cartaro, C; Chauveau, J; Chen, C; Chiang, CC; Cowan, R; Dalseno, J

Published Date

  • November 15, 2014

Published In

Volume / Issue

  • 74 / 11

Start / End Page

  • 1 - 928

Electronic International Standard Serial Number (EISSN)

  • 1434-6052

International Standard Serial Number (ISSN)

  • 1434-6044

Digital Object Identifier (DOI)

  • 10.1140/epjc/s10052-014-3026-9

Citation Source

  • Scopus