Electronic and elemental properties of the Cu2ZnSn(S,Se)4surface and grain boundaries


Journal Article

X-ray and femtosecond UV photoelectron spectroscopy, secondary ion mass spectrometry and photoluminescence imaging were used to investigate the electronic and elemental properties of the CZTS,Se surface and its oxides. Oxide removal reveals a very Cu poor and Zn rich surface relative to bulk composition. O and Na are observed at the surface and throughout the bulk. Upward bending of the valence bands indicates the presence of negative charge in the surface region and the Fermi level is found near the band gap center. The presence of point defects and the impact of these findings on grain boundary properties will be described. © 2014 AIP Publishing LLC.

Full Text

Duke Authors

Cited Authors

  • Haight, R; Shao, X; Wang, W; Mitzi, DB

Published Date

  • January 20, 2014

Published In

Volume / Issue

  • 104 / 3

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.4862791

Citation Source

  • Scopus