Deformation of top-down and bottom-up silver nanowires
Atomistic simulations are employed to probe the deformation behavior of experimentally observed top-down and bottom-up face-centered cubic silver nanowires. Stable, 〈110〉 oriented nanowires with a rhombic and truncated-rhombic cross section are considered, representative of top-down geometries, as well as the multiply twinned pentagonal nanowire that is commonly fabricated in a bottom-up approach. The tensile deformation of a stable, experimentally observed structure is simulated to failure for each nanowire structure. A detailed, mechanistic explanation of the initial defect nucleation is provided for each nanowire. The three geometries are shown to exhibit different levels of strength and to deform by a range of mechanisms depending on the nanowire structure. In particular, the deformation behavior of top-down and bottom-up nanowires is shown to be fundamentally different. The yield strength of nanowires ranging from 1 to 25 nm in diameter is provided and reveals that in addition to cross-sectional diameter, the strength of the nanowires is strongly tied to the structure. This study demonstrates that nanowire structure and size may be tailored for specific mechanical requirements in nanometer-scale devices. © 2007 WILEY-VCH Verlag GmbH & Co. KGaA.
Leach, AM; McDowell, M; Gall, K
Volume / Issue
Start / End Page
Electronic International Standard Serial Number (EISSN)
International Standard Serial Number (ISSN)
Digital Object Identifier (DOI)