Look closely: Lessons prof. Gérard T. Simon might have taught

Published

Conference Paper

Full Text

Published version (via Digital Object Identifier)

Duke Authors

Howell, David Noble

Cited Authors

Howell, DN

Published Date

January 1, 2014

Published In

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Volume / Issue

20 / 3

Start / End Page

1164 - 1165

Electronic International Standard Serial Number (EISSN)

1435-8115

International Standard Serial Number (ISSN)

1431-9276

Digital Object Identifier (DOI)

10.1017/S1431927614007557

Citation Source

Scopus