Millimeter wave surface and reflectivity estimation based on sparse time of flight measurements


Journal Article

© 2014 IEEE. We present a novel active millimeter wave imaging technique that can be used to estimate target surface and reflectivity. This technique requires no mechanical scanning but requires only a sparse array of detectors. The illumination beam requires no focusing or collimation. The reconstruction is based on the time of flight information from the reflected signal.

Full Text

Duke Authors

Cited Authors

  • Zhu, R; Furxhi, O; Marks, D; Brady, D

Published Date

  • January 1, 2014

Published In

Electronic International Standard Serial Number (EISSN)

  • 2162-2035

International Standard Serial Number (ISSN)

  • 2162-2027

Digital Object Identifier (DOI)

  • 10.1109/IRMMW-THz.2014.6956301

Citation Source

  • Scopus