An Aberration Corrected Photoemission Electron Microscope at the Advanced Light Source

Conference Paper

Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light Source is outlined. PEEM3 will be installed on an elliptically polarized undulator beamline and will be used for the study of complex materials at high spatial and spectral resolution. The critical components of PEEM3 are the electron mirror aberration corrector and aberration-free magnetic beam separator. The models to calculate the optical properties of the electron mirror are discussed. The goal of the PEEM3 project is to achieve the highest possible transmission of the system at resolutions comparable to our present PEEM2 system (50 nm) and to enable significantly higher resolution, albeit at the sacrifice of intensity. We have left open the possibility to add an energy filter at a later date, if it becomes necessary driven by scientific need to improve the resolution further.

Full Text

Duke Authors

Cited Authors

  • Feng, J; MacDowell, AA; Duarte, R; Doran, A; Forest, E; Kelez, N; Marcus, M; Munson, D; Padmore, H; Petermann, K; Raoux, S; Robin, D; Scholl, A; Schlueter, R; Schmid, P; Stöhr, J; Wan, W; Wei, DH; Wu, Y

Published Date

  • May 12, 2004

Published In

Volume / Issue

  • 705 /

Start / End Page

  • 1070 - 1073

Electronic International Standard Serial Number (EISSN)

  • 1551-7616

International Standard Serial Number (ISSN)

  • 0094-243X

International Standard Book Number 10 (ISBN-10)

  • 0735401799

Digital Object Identifier (DOI)

  • 10.1063/1.1757983

Citation Source

  • Scopus