Phonon softening and metallization of a narrow-gap semiconductor by thermal disorder

Journal Article

Full Text

Duke Authors

Cited Authors

  • Delaire, O; Marty, K; Stone, MB; Kent, PRC; Lucas, MS; Abernathy, DL; Mandrus, D; Sales, BC

Published Date

  • March 22, 2011

Published In

Volume / Issue

  • 108 / 12

Start / End Page

  • 4725 - 4730

Electronic International Standard Serial Number (EISSN)

  • 1091-6490

International Standard Serial Number (ISSN)

  • 0027-8424

Digital Object Identifier (DOI)

  • 10.1073/pnas.1014869108