Global Yield Curve Event Risks

Published

Journal Article

Full Text

Duke Authors

Cited Authors

  • Fung, W; Hsieh, DA

Published Date

  • September 30, 1996

Published In

Volume / Issue

  • 6 / 2

Start / End Page

  • 37 - 48

Published By

Electronic International Standard Serial Number (EISSN)

  • 2168-8648

International Standard Serial Number (ISSN)

  • 1059-8596

Digital Object Identifier (DOI)

  • 10.3905/jfi.1996.408175

Language

  • en