Global Yield Curve Event Risks
Published
Journal Article
Full Text
Duke Authors
Cited Authors
- Fung, W; Hsieh, DA
Published Date
- September 30, 1996
Published In
Volume / Issue
- 6 / 2
Start / End Page
- 37 - 48
Published By
Electronic International Standard Serial Number (EISSN)
- 2168-8648
International Standard Serial Number (ISSN)
- 1059-8596
Digital Object Identifier (DOI)
- 10.3905/jfi.1996.408175
Language
- en