Systematic measurement of AlxGa1-xN refractive indices

Journal Article (Journal Article)

Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic Al Ga N epitaxial layers with 0.0≤x≤1.0 throughout the visible wavelength region. The dispersion, measured by a prism coupling waveguide technique, is found to be well described by a Sellmeier relation. Discrepancies among previous measurements of refractive index dispersion, as a consequence of different growth conditions and corresponding band gap bowing parameter, are reconciled when the Sellmeier relation is parameterized not by x but by band gap energy. © 2001 American Institute of Physics. x 1-x

Full Text

Duke Authors

Cited Authors

  • Özgür, U; Webb-Wood, G; Everitt, HO; Yun, F; Morkoç, H

Published Date

  • December 17, 2001

Published In

Volume / Issue

  • 79 / 25

Start / End Page

  • 4103 - 4105

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.1426270

Citation Source

  • Scopus