Systematic measurement of AlxGa1-xN refractive indices
Journal Article (Journal Article)
Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic Al Ga N epitaxial layers with 0.0≤x≤1.0 throughout the visible wavelength region. The dispersion, measured by a prism coupling waveguide technique, is found to be well described by a Sellmeier relation. Discrepancies among previous measurements of refractive index dispersion, as a consequence of different growth conditions and corresponding band gap bowing parameter, are reconciled when the Sellmeier relation is parameterized not by x but by band gap energy. © 2001 American Institute of Physics. x 1-x
Full Text
Duke Authors
Cited Authors
- Özgür, U; Webb-Wood, G; Everitt, HO; Yun, F; Morkoç, H
Published Date
- December 17, 2001
Published In
Volume / Issue
- 79 / 25
Start / End Page
- 4103 - 4105
International Standard Serial Number (ISSN)
- 0003-6951
Digital Object Identifier (DOI)
- 10.1063/1.1426270
Citation Source
- Scopus