Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits

Conference Paper

This work evaluates crosstalk and transmission efficiency in multi-integrated field emission vacuum microelectronic devices (FE-VMDs). Experimental evidence showed that proximity effects cannot be neglected, therefore indicating a need for additional control to take full advantage of the potential microfabricated packing density. Simulations were used to understand the root cause, design structural solutions, and improve overall device performance. Furthermore, charged particle transmission was experimentally investigated for initial structures and new design features are proposed for improved performance.

Full Text

Duke Authors

Cited Authors

  • Radauscher, EJ; Gilchrist, KH; Di Dona, ST; Russell, ZE; Piascik, JR; Parker, CB; Stoner, BR; Glass, JT

Published Date

  • February 16, 2015

Published In

Volume / Issue

  • 2016-February /

Start / End Page

  • 33.2.1 - 33.2.4

International Standard Serial Number (ISSN)

  • 0163-1918

International Standard Book Number 13 (ISBN-13)

  • 9781467398930

Digital Object Identifier (DOI)

  • 10.1109/IEDM.2015.7409819

Citation Source

  • Scopus