Critical Current Scaling in Long Diffusive Graphene-Based Josephson Junctions.

Journal Article (Journal Article)

We present transport measurements on long, diffusive, graphene-based Josephson junctions. Several junctions are made on a single-domain crystal of CVD graphene and feature the same contact width of ∼9 μm but vary in length from 400 to 1000 nm. As the carrier density is tuned with the gate voltage, the critical current in these junctions ranges from a few nanoamperes up to more than 5 μA, while the Thouless energy, ETh, covers almost 2 orders of magnitude. Over much of this range, the product of the critical current and the normal resistance ICRN is found to scale linearly with ETh, as expected from theory. However, the value of the ratio ICRN/ETh is found to be 0.1-0.2, which much smaller than the predicted ∼10 for long diffusive SNS junctions.

Full Text

Duke Authors

Cited Authors

  • Ke, CT; Borzenets, IV; Draelos, AW; Amet, F; Bomze, Y; Jones, G; Craciun, M; Russo, S; Yamamoto, M; Tarucha, S; Finkelstein, G

Published Date

  • August 2016

Published In

Volume / Issue

  • 16 / 8

Start / End Page

  • 4788 - 4791

PubMed ID

  • 27388297

Electronic International Standard Serial Number (EISSN)

  • 1530-6992

International Standard Serial Number (ISSN)

  • 1530-6984

Digital Object Identifier (DOI)

  • 10.1021/acs.nanolett.6b00738


  • eng