Threshold-voltage instability in MOSFET's due to channel hot-hole emission

Published

Journal Article

Full Text

Duke Authors

Cited Authors

  • Fair, RB; Sun, RC

Published Date

  • January 1981

Published In

Volume / Issue

  • 28 / 1

Start / End Page

  • 83 - 94

Published By

International Standard Serial Number (ISSN)

  • 0018-9383

Digital Object Identifier (DOI)

  • 10.1109/t-ed.1981.20287