Threshold-voltage instability in MOSFET's due to channel hot-hole emission

Journal Article

Full Text

Duke Authors

Cited Authors

  • Fair, R; Sun, R

Published Date

  • January 1981

Published In

Volume / Issue

  • 28 / 1

Start / End Page

  • 83 - 94

International Standard Serial Number (ISSN)

  • 0018-9383

Digital Object Identifier (DOI)

  • 10.1109/T-ED.1981.20287