Polymer thin film waveguide sensors: Characterization of scattered light intensity at the waveguide surface

Published

Journal Article

The evanescent and scattered light from poly(styrene) thin film waveguides are being investigated to evaluate the potential use of integrated optic waveguides as sensors. A fiber optic system is described for measuring the light intensity of different waveguide modes in two directions; perpendicular to the waveguide streak and parallel to the streak as a measure of decay. Rayleigh and poly(styrene) Raman scattered light are used as intensity indicators and the advantages and disadvantages of each are discussed. Profiles of Raman scattered light across the waveguide streak are shown as a function of position along the waveguide. Decay measurements of four waveguide modes along a single waveguide are divided into three regions with different rates of decay and possible causes. These results show that the excitation field along the surface of 10 waveguides is predominantly scattered light rather than surface localized evanescent light. © SPIE.

Full Text

Duke Authors

Cited Authors

  • Ives, JT; Reichert, WM; Andrade, JD

Published Date

  • January 19, 1988

Published In

Volume / Issue

  • 822 /

Start / End Page

  • 182 - 187

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

International Standard Serial Number (ISSN)

  • 0277-786X

Digital Object Identifier (DOI)

  • 10.1117/12.941952

Citation Source

  • Scopus