Capacity-achieving ensembles for the binary erasure channel with bounded complexity
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Pfister, H; Sason, I; Urbanke, R
Published in: IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
December 1, 2004
We present two sequences of ensembles of non-systematic irregular repeat-accumulate codes which asymptotically (as their block length tends to infinity) achieve capacity on the binary erasure channel (BEC) with bounded complexity. This is in contrast to all previous constructions of capacity-achieving sequences of ensembles whose complexity grows at least like the log of the inverse of the gap to capacity. The new bounded complexity result is achieved by allowing a sufficient number of state nodes in the Tanner graph representing the codes. ©2004 IEEE.
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IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
Publication Date
December 1, 2004
Start / End Page
110 / 113
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Pfister, H., Sason, I., & Urbanke, R. (2004). Capacity-achieving ensembles for the binary erasure channel with bounded complexity. In IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings (pp. 110–113).
Pfister, H., I. Sason, and R. Urbanke. “Capacity-achieving ensembles for the binary erasure channel with bounded complexity.” In IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings, 110–13, 2004.
Pfister H, Sason I, Urbanke R. Capacity-achieving ensembles for the binary erasure channel with bounded complexity. In: IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings. 2004. p. 110–3.
Pfister, H., et al. “Capacity-achieving ensembles for the binary erasure channel with bounded complexity.” IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings, 2004, pp. 110–13.
Pfister H, Sason I, Urbanke R. Capacity-achieving ensembles for the binary erasure channel with bounded complexity. IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings. 2004. p. 110–113.
Published In
IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
Publication Date
December 1, 2004
Start / End Page
110 / 113