Robust parametric and semi-parametric spot fitting for spot array images.

Journal Article

In this paper we address the problem of reliably fitting parametric and semi-parametric models to spots in high density spot array images obtained in gene expression experiments. The goal is to measure the amount of label bound to an array element. A lot of spots can be modelled accurately by a Gaussian shape. In order to deal with highly overlapping spots we use robust M-estimators. When the parametric method fails (which can be detected automatically) we use a novel, robust semi-parametric method which can handle spots of different shapes accurately. The introduced techniques are evaluated experimentally.

Duke Authors

Cited Authors

  • Brändle, N; Chen, HY; Bischof, H; Lapp, H

Published Date

  • January 2000

Published In

Volume / Issue

  • 8 /

Start / End Page

  • 46 - 56

PubMed ID

  • 10977065

International Standard Serial Number (ISSN)

  • 1553-0833

Language

  • eng