Near Field Scan Alignment Procedure for Electrically Large Apertures

Journal Article

Full Text

Duke Authors

Cited Authors

  • Sleasman, T; Imani, MF; Yurduseven, O; Trofatter, KP; Gowda, VR; Marks, DL; Gollub, JN; Smith, DR

Published Date

  • June 2017

Published In

Volume / Issue

  • 65 / 6

Start / End Page

  • 3257 - 3262

Electronic International Standard Serial Number (EISSN)

  • 1558-2221

International Standard Serial Number (ISSN)

  • 0018-926X

Digital Object Identifier (DOI)

  • 10.1109/TAP.2017.2691465