Updated T2K measurements of muon neutrino and antineutrino disappearance using protons on target

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Cited Authors

  • Abe, K; Amey, J; Andreopoulos, C; Antonova, M; Aoki, S; Ariga, A; Ashida, Y; Autiero, D; Ban, S; Barbi, M; Barker, GJ; Barr, G; Barry, C; Bartet-Friburg, P; Batkiewicz, M; Berardi, V; Berkman, S; Bhadra, S; Bienstock, S; Blondel, A; Bolognesi, S; Bordoni, S; Boyd, SB; Brailsford, D; Bravar, A; Bronner, C; Buizza Avanzini, M; Calland, RG; Campbell, T; Cao, S; Cartwright, SL; Catanesi, MG; Cervera, A; Chappell, A; Checchia, C; Cherdack, D; Chikuma, N; Christodoulou, G; Clifton, A; Coleman, J; Collazuol, G; Coplowe, D; Cudd, A; Dabrowska, A; De Rosa, G; Dealtry, T; Denner, PF; Dennis, SR; Densham, C; Dewhurst, D; Di Lodovico, F; Dolan, S; Drapier, O; Duffy, KE; Dumarchez, J; Dunne, P; Dziewiecki, M; Emery-Schrenk, S; Ereditato, A; Feusels, T; Finch, AJ; Fiorentini, GA; Friend, M; Fujii, Y; Fukuda, D; Fukuda, Y; Galymov, V; Garcia, A; Giganti, C; Gizzarelli, F; Golan, T; Gonin, M; Hadley, DR; Haegel, L; Haigh, JT; Hansen, D; Harada, J; Hartz, M; Hasegawa, T; Hastings, NC; Hayashino, T; Hayato, Y; Helmer, RL; Hillairet, A; Hiraki, T; Hiramoto, A; Hirota, S; Hogan, M; Holeczek, J; Hosomi, F; Huang, K; Ichikawa, AK; Ikeda, M; Imber, J; Insler, J; Intonti, RA; Ishida, T; Ishii, T; Iwai, E; Iwamoto, K; Izmaylov, A; Jamieson, B; Jiang, M; Johnson, S; Jonsson, P; Jung, CK; Kabirnezhad, M; Kaboth, AC; Kajita, T; Kakuno, H; Kameda, J; Karlen, D; Katori, T; Kearns, E; Khabibullin, M; Khotjantsev, A; Kim, H; Kim, J; King, S; Kisiel, J; Knight, A; Knox, A; Kobayashi, T; Koch, L; Koga, T; Koller, PP; Konaka, A; Kormos, LL; Korzenev, A; Koshio, Y; Kowalik, K; Kropp, W; Kudenko, Y; Kurjata, R; Kutter, T; Lagoda, J; Lamont, I; Lamoureux, M; Larkin, E; Lasorak, P; Laveder, M; Lawe, M; Licciardi, M; Lindner, T; Liptak, ZJ; Litchfield, RP; Li, X; Longhin, A; Lopez, JP; Lou, T; Ludovici, L; Lu, X; Magaletti, L; Mahn, K; Malek, M; Manly, S; Maret, L; Marino, AD; Martin, JF; Martins, P; Martynenko, S; Maruyama, T; Matveev, V; Mavrokoridis, K; Ma, WY; Mazzucato, E; McCarthy, M; McCauley, N; McFarland, KS; McGrew, C; Mefodiev, A; Metelko, C; Mezzetto, M; Mijakowski, P; Minamino, A; Mineev, O; Mine, S; Missert, A; Miura, M; Moriyama, S; Morrison, J; Mueller, TA; Myslik, J; Nakadaira, T; Nakahata, M; Nakamura, KG; Nakamura, K; Nakamura, KD; Nakanishi, Y; Nakayama, S; Nakaya, T; Nakayoshi, K; Nantais, C; Nielsen, C; Nirkko, M; Nishikawa, K; Nishimura, Y; Novella, P; Nowak, J; O’Keeffe, HM; Okumura, K; Okusawa, T; Oryszczak, W; Oser, SM; Ovsyannikova, T; Owen, RA; Oyama, Y; Palladino, V; Palomino, JL; Paolone, V; Patel, ND; Paudyal, P; Pavin, M; Payne, D; Perkin, JD; Petrov, Y; Pickard, L; Pickering, L; Pinzon Guerra, ES; Pistillo, C; Popov, B; Posiadala-Zezula, M; Poutissou, J-M; Poutissou, R; Pritchard, A; Przewlocki, P; Quilain, B; Radermacher, T; Radicioni, E; Ratoff, PN; Ravonel, M; Rayner, MA; Redij, A; Reinherz-Aronis, E; Riccio, C; Rondio, E; Rossi, B; Roth, S; Rubbia, A; Ruggeri, AC; Rychter, A; Sakashita, K; Sánchez, F; Scantamburlo, E; Scholberg, K; Schwehr, J; Scott, M; Seiya, Y; Sekiguchi, T; Sekiya, H; Sgalaberna, D; Shah, R; Shaikhiev, A; Shaker, F; Shaw, D; Shiozawa, M; Shirahige, T; Short, S; Smy, M; Sobczyk, JT; Sobel, H; Sorel, M; Southwell, L; Steinmann, J; Stewart, T; Stowell, P; Suda, Y; Suvorov, S; Suzuki, A; Suzuki, SY; Suzuki, Y; Tacik, R; Tada, M; Takeda, A; Takeuchi, Y; Tamura, R; Tanaka, HK; Tanaka, HA; Terhorst, D; Terri, R; Thakore, T; Thompson, LF; Tobayama, S; Toki, W; Tomura, T; Touramanis, C; Tsukamoto, T; Tzanov, M; Uchida, Y; Vagins, M; Vallari, Z; Vasseur, G; Vilela, C; Vladisavljevic, T; Wachala, T; Walter, CW; Wark, D; Wascko, MO; Weber, A; Wendell, R; Wilkes, RJ; Wilking, MJ; Wilkinson, C; Wilson, JR; Wilson, RJ; Wret, C; Yamada, Y; Yamamoto, K; Yamamoto, M; Yanagisawa, C; Yano, T; Yen, S; Yershov, N; Yokoyama, M; Yoshida, K; Yuan, T; Yu, M; Zalewska, A; Zalipska, J; Zambelli, L; Zaremba, K; Ziembicki, M; Zimmerman, ED; Zito, M; Żmuda, J

Published Date

  • July 2017

Published In

Volume / Issue

  • 96 / 1

Electronic International Standard Serial Number (EISSN)

  • 2470-0029

International Standard Serial Number (ISSN)

  • 2470-0010

Digital Object Identifier (DOI)

  • 10.1103/PhysRevD.96.011102