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A 1.0V 45nm nonvolatile magnetic latch design and its robustness analysis

Publication ,  Conference
Wang, P; Chen, X; Chen, Y; Li, H; Kang, S; Zhu, X; Wu, W
Published in: Proceedings of the Custom Integrated Circuits Conference
November 9, 2011

A new nonvolatile latch design is proposed based on the magnetic tunneling junction (MTJ) devices. In the standby mode, the latched data can be retained in the MTJs without consuming any power. Two types of operation errors, namely, persistent and non-persistent errors, are quantitatively analyzed by including the process variations and thermal fluctuations during the read and write operations. A design at 45nm technology node is used as the example to discuss the design tradeoffs. © 2011 IEEE.

Duke Scholars

Published In

Proceedings of the Custom Integrated Circuits Conference

DOI

ISSN

0886-5930

ISBN

9781457702228

Publication Date

November 9, 2011
 

Citation

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Wang, P., Chen, X., Chen, Y., Li, H., Kang, S., Zhu, X., & Wu, W. (2011). A 1.0V 45nm nonvolatile magnetic latch design and its robustness analysis. In Proceedings of the Custom Integrated Circuits Conference. https://doi.org/10.1109/CICC.2011.6055392
Wang, P., X. Chen, Y. Chen, H. Li, S. Kang, X. Zhu, and W. Wu. “A 1.0V 45nm nonvolatile magnetic latch design and its robustness analysis.” In Proceedings of the Custom Integrated Circuits Conference, 2011. https://doi.org/10.1109/CICC.2011.6055392.
Wang P, Chen X, Chen Y, Li H, Kang S, Zhu X, et al. A 1.0V 45nm nonvolatile magnetic latch design and its robustness analysis. In: Proceedings of the Custom Integrated Circuits Conference. 2011.
Wang, P., et al. “A 1.0V 45nm nonvolatile magnetic latch design and its robustness analysis.” Proceedings of the Custom Integrated Circuits Conference, 2011. Scopus, doi:10.1109/CICC.2011.6055392.
Wang P, Chen X, Chen Y, Li H, Kang S, Zhu X, Wu W. A 1.0V 45nm nonvolatile magnetic latch design and its robustness analysis. Proceedings of the Custom Integrated Circuits Conference. 2011.

Published In

Proceedings of the Custom Integrated Circuits Conference

DOI

ISSN

0886-5930

ISBN

9781457702228

Publication Date

November 9, 2011