Report of AAPM Task Group 162: Software for planar image quality metrology.

Journal Article (Journal Article)

PURPOSE: The AAPM Task Group 162 aimed to provide a standardized approach for the assessment of image quality in planar imaging systems. This report offers a description of the approach as well as the details of the resultant software bundle to measure detective quantum efficiency (DQE) as well as its basis components and derivatives. METHODS: The methodology and the associated software include the characterization of the noise power spectrum (NPS) from planar images acquired under specific acquisition conditions, modulation transfer function (MTF) using an edge test object, the DQE, and effective DQE (eDQE). First, a methodological framework is provided to highlight the theoretical basis of the work. Then, a step-by-step guide is included to assist in proper execution of each component of the code. Lastly, an evaluation of the method is included to validate its accuracy against model-based and experimental data. RESULTS: The code was built using a Macintosh OSX operating system. The software package contains all the source codes to permit an experienced user to build the suite on a Linux or other *nix type system. The package further includes manuals and sample images and scripts to demonstrate use of the software for new users. The results of the code are in close alignment with theoretical expectations and published results of experimental data. CONCLUSIONS: The methodology and the software package offered in AAPM TG162 can be used as baseline for characterization of inherent image quality attributes of planar imaging systems.

Full Text

Duke Authors

Cited Authors

  • Samei, E; Ikejimba, LC; Harrawood, BP; Rong, J; Cunningham, IA; Flynn, MJ

Published Date

  • February 2018

Published In

Volume / Issue

  • 45 / 2

Start / End Page

  • e32 - e39

PubMed ID

  • 29220101

Electronic International Standard Serial Number (EISSN)

  • 2473-4209

Digital Object Identifier (DOI)

  • 10.1002/mp.12718


  • eng

Conference Location

  • United States