MPME-DP: Multi-population moment estimation via dirichlet process for efficient validation of analog/mixed-signal circuits

Published

Conference Paper

© 2014 IEEE. Moment estimation is one of the most important tasks to appropriately characterize the performance variability of today's nanoscale integrated circuits. In this paper, we propose an efficient algorithm of multi-population moment estimation via Dirichlet Process (MPME-DP) for validation of analog and mixed-signal circuits with extremely small sample size. The key idea is to partition all populations (e.g., different environmental conditions, setup configurations, etc.) into groups. The populations within the same group are similar and their common knowledge can be extracted to improve the accuracy of moment estimation. As will be demonstrated by the silicon measurement data of a high-speed I/O link, MPME-DP reduces the moment estimation error by up to 65% compared to other conventional estimators.

Full Text

Duke Authors

Cited Authors

  • Zaheer, M; Li, X; Gu, C

Published Date

  • January 5, 2015

Published In

Volume / Issue

  • 2015-January / January

Start / End Page

  • 316 - 323

International Standard Serial Number (ISSN)

  • 1092-3152

International Standard Book Number 13 (ISBN-13)

  • 9781479962785

Digital Object Identifier (DOI)

  • 10.1109/ICCAD.2014.7001369

Citation Source

  • Scopus