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Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data

Publication ,  Conference
Wang, F; Zhang, W; Sun, S; Li, X; Gu, C
Published in: Proceedings - Design Automation Conference
July 12, 2013

Efficient high-dimensional performance modeling of today's complex analog and mixed-signal (AMS) circuits with large-scale process variations is an important yet challenging task. In this paper, we propose a novel performance modeling algorithm that is referred to as Bayesian Model Fusion (BMF). Our key idea is to borrow the simulation data generated from an early stage (e.g., schematic level) to facilitate efficient high-dimensional performance modeling at a late stage (e.g., post layout) with low computational cost. Such a goal is achieved by statistically modeling the performance correlation between early and late stages through Bayesian inference. Several circuit examples designed in a commercial 32nm CMOS process demonstrate that BMF achieves up to 9X runtime speedup over the traditional modeling technique without surrendering any accuracy. Copyright © 2013 ACM.

Duke Scholars

Published In

Proceedings - Design Automation Conference

DOI

ISSN

0738-100X

ISBN

9781450320719

Publication Date

July 12, 2013
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Wang, F., Zhang, W., Sun, S., Li, X., & Gu, C. (2013). Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data. In Proceedings - Design Automation Conference. https://doi.org/10.1145/2463209.2488812
Wang, F., W. Zhang, S. Sun, X. Li, and C. Gu. “Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data.” In Proceedings - Design Automation Conference, 2013. https://doi.org/10.1145/2463209.2488812.
Wang F, Zhang W, Sun S, Li X, Gu C. Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data. In: Proceedings - Design Automation Conference. 2013.
Wang, F., et al. “Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data.” Proceedings - Design Automation Conference, 2013. Scopus, doi:10.1145/2463209.2488812.
Wang F, Zhang W, Sun S, Li X, Gu C. Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data. Proceedings - Design Automation Conference. 2013.

Published In

Proceedings - Design Automation Conference

DOI

ISSN

0738-100X

ISBN

9781450320719

Publication Date

July 12, 2013