Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables

Published

Conference Paper

In this paper, we investigate the geometry dependence for the local variation of low-frequency noise in MOSFETs via the sum of lognormal random variables. A compact model has been developed and applied to the measured data with excellent match, and therefore enables the coverage of low-frequency noise statistics in circuit design. © 2012 IEEE.

Full Text

Duke Authors

Cited Authors

  • Yu, B; Li, X; Yonemura, J; Wu, Z; Goo, JS; Thuruthiyil, C; Icel, A

Published Date

  • November 26, 2012

Published In

International Standard Serial Number (ISSN)

  • 0886-5930

International Standard Book Number 13 (ISBN-13)

  • 9781467315555

Digital Object Identifier (DOI)

  • 10.1109/CICC.2012.6330573

Citation Source

  • Scopus