Large-scale statistical performance modeling of analog and mixed-signal circuits

Published

Conference Paper

The aggressive scaling of IC technology results in large-scale performance variations that cannot be efficiently captured by traditional modeling techniques. This paper presents the recent development of statistical performance modeling and its important applications. In particular, we focus on two core techniques, sparse regression (SR) and Bayesian model fusion (BMF), that facilitate large-scale performance modeling with low computational cost. The basic ideas of SR and BMF are first explained and then their efficacy is compared to other traditional modeling approaches by using several analog and mixed-signal circuit examples. © 2012 IEEE.

Full Text

Duke Authors

Cited Authors

  • Li, X; Zhang, W; Wang, F

Published Date

  • November 26, 2012

Published In

International Standard Serial Number (ISSN)

  • 0886-5930

International Standard Book Number 13 (ISBN-13)

  • 9781467315555

Digital Object Identifier (DOI)

  • 10.1109/CICC.2012.6330570

Citation Source

  • Scopus