Indirect phase noise sensing for self-healing voltage controlled oscillators

Published

Conference Paper

The push for higher performance analog/RF circuits in scaled CMOS necessitates self-healing via post-manufacturing tuning. A major challenge with self-healing systems is the efficient design of on-chip sensors that capture the performance of interest. This is particularly difficult for metrics such as phase noise that are not easily measured on-chip. We propose an indirect sensing method that exploits the correlations between the performance metrics of interest and those that can be measured using easy-to-integrate sensors. We demonstrate indirect phase noise sensing for a 25GHz self-healing voltage controlled oscillator (VCO) design in 32nm CMOS SOI that approaches the best parametric yield achievable based on simulated results. © 2011 IEEE.

Full Text

Duke Authors

Cited Authors

  • Yaldiz, S; Calayir, V; Li, X; Pileggi, L; Natarajan, AS; Ferriss, MA; Tierno, J

Published Date

  • November 9, 2011

Published In

International Standard Serial Number (ISSN)

  • 0886-5930

International Standard Book Number 13 (ISBN-13)

  • 9781457702228

Digital Object Identifier (DOI)

  • 10.1109/CICC.2011.6055416

Citation Source

  • Scopus