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Benchmarking the PSP compact model for MOS transistors

Publication ,  Conference
Li, X; Wu, W; Jha, A; Gildenblat, G; Van Langevelde, R; Smit, GDJ; Scholten, AJ; Klaassen, DBM; McAndrew, CC; Watts, J; Olsen, M; Coram, G ...
Published in: IEEE International Conference on Microelectronic Test Structures
September 27, 2007

Recently, the PSP model was selected as the first surface-potential-based industry standard compact MOSFET model. This work presents the results of several qualitative "benchmark" tests that over the last two years were used to verify the physical behavior of the new model and its usefulness for future generations of CMOS IC design. These include newly developed tests and previously unavailable experimental data stemming from low-power, RF, mixed-signal, and analog applications of MOSFETs. © 2007 IEEE.

Duke Scholars

Published In

IEEE International Conference on Microelectronic Test Structures

DOI

ISBN

9781424407804

Publication Date

September 27, 2007

Start / End Page

259 / 264
 

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Li, X., Wu, W., Jha, A., Gildenblat, G., Van Langevelde, R., Smit, G. D. J., … Victory, J. (2007). Benchmarking the PSP compact model for MOS transistors. In IEEE International Conference on Microelectronic Test Structures (pp. 259–264). https://doi.org/10.1109/ICMTS.2007.374495
Li, X., W. Wu, A. Jha, G. Gildenblat, R. Van Langevelde, G. D. J. Smit, A. J. Scholten, et al. “Benchmarking the PSP compact model for MOS transistors.” In IEEE International Conference on Microelectronic Test Structures, 259–64, 2007. https://doi.org/10.1109/ICMTS.2007.374495.
Li X, Wu W, Jha A, Gildenblat G, Van Langevelde R, Smit GDJ, et al. Benchmarking the PSP compact model for MOS transistors. In: IEEE International Conference on Microelectronic Test Structures. 2007. p. 259–64.
Li, X., et al. “Benchmarking the PSP compact model for MOS transistors.” IEEE International Conference on Microelectronic Test Structures, 2007, pp. 259–64. Scopus, doi:10.1109/ICMTS.2007.374495.
Li X, Wu W, Jha A, Gildenblat G, Van Langevelde R, Smit GDJ, Scholten AJ, Klaassen DBM, McAndrew CC, Watts J, Olsen M, Coram G, Chaudhrytt S, Victory J. Benchmarking the PSP compact model for MOS transistors. IEEE International Conference on Microelectronic Test Structures. 2007. p. 259–264.

Published In

IEEE International Conference on Microelectronic Test Structures

DOI

ISBN

9781424407804

Publication Date

September 27, 2007

Start / End Page

259 / 264