Projection-based performance modeling for inter/intra-die variations


Conference Paper

Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations. Fitting such models requires significantly more simulation samples and solving much larger linear equations. In this paper, we propose a novel projection-based extraction approach, PROBE, to efficiently create quadratic response surface models and capture both interdie and intra-die variations with affordable computation cost. PROBE applies a novel projection scheme to reduce the response surface modeling cost (i.e., both the required number of samples and the linear equation size) and make the modeling problem tractable even for large problem sizes. In addition, a new implicit power iteration algorithm is developed to find the optimal projection space and solve for the unknown model coefficients. Several circuit examples from both digital and analog circuit modeling applications demonstrate that PROBE can generate accurate response surface models while achieving up to 12x speedup compared with the traditional methods. © 2005 IEEE.

Full Text

Duke Authors

Cited Authors

  • Li, X; Le, J; Pileggi, LT; Strojwas, A

Published Date

  • December 1, 2005

Published In

Volume / Issue

  • 2005 /

Start / End Page

  • 720 - 726

International Standard Serial Number (ISSN)

  • 1092-3152

International Standard Book Number 10 (ISBN-10)

  • 078039254X

International Standard Book Number 13 (ISBN-13)

  • 9780780392540

Digital Object Identifier (DOI)

  • 10.1109/ICCAD.2005.1560160

Citation Source

  • Scopus