Benchmark tests for MOSFET compact models with application to the PSP model

Journal Article (Journal Article)

This paper presents the results of several qualitative "benchmark" tests that were used to verify the physical behavior of the PSP model and its usefulness for future generations of CMOS IC design. These include newly developed tests and new experimental data stemming from low-power, RF, mixed-signal, and analog applications of MOSFETs. © 2009 IEEE.

Full Text

Duke Authors

Cited Authors

  • Li, X; Wu, W; Jha, A; Gildenblat, G; van Langevelde, R; Smit, GDJ; Scholten, AJ; Klaassen, DBM; McAndrew, CC; Watts, J; Olsen, CM; Coram, GJ; Chaudhry, S; Victory, J

Published Date

  • January 23, 2009

Published In

Volume / Issue

  • 56 / 2

Start / End Page

  • 243 - 251

International Standard Serial Number (ISSN)

  • 0018-9383

Digital Object Identifier (DOI)

  • 10.1109/TED.2008.2010570

Citation Source

  • Scopus