Loading and characterization of a printed-circuit-board atomic ion trap
We demonstrate loading of Sr+88 ions into a 0.5-mm -scale printed circuit board surface-electrode ion trap. We then characterize the trap by measuring the secular frequencies and comparing them to a three-dimensional simulation of the trap, and by measuring the stray electric fields along two of the trapâ€™s principal axes. Cancelling these fields by applying additional voltages enables a hundredfold increase in the trap lifetime to greater than ten minutes at a vacuum of 10a 9 torr. © 2007 The American Physical Society.
Brown, KR; Clark, RJ; Labaziewicz, J; Richerme, P; Leibrandt, DR; Chuang, IL
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