Loading and characterization of a printed-circuit-board atomic ion trap

Journal Article (Journal Article)

We demonstrate loading of Sr+88 ions into a 0.5-mm -scale printed circuit board surface-electrode ion trap. We then characterize the trap by measuring the secular frequencies and comparing them to a three-dimensional simulation of the trap, and by measuring the stray electric fields along two of the trap’s principal axes. Cancelling these fields by applying additional voltages enables a hundredfold increase in the trap lifetime to greater than ten minutes at a vacuum of 10a 9 torr. © 2007 The American Physical Society.

Full Text

Duke Authors

Cited Authors

  • Brown, KR; Clark, RJ; Labaziewicz, J; Richerme, P; Leibrandt, DR; Chuang, IL

Published Date

  • January 30, 2007

Published In

Volume / Issue

  • 75 / 1

Electronic International Standard Serial Number (EISSN)

  • 1094-1622

International Standard Serial Number (ISSN)

  • 1050-2947

Digital Object Identifier (DOI)

  • 10.1103/PhysRevA.75.015401

Citation Source

  • Scopus