Loading and characterization of a printed-circuit-board atomic ion trap
Journal Article (Journal Article)
We demonstrate loading of Sr+88 ions into a 0.5-mm -scale printed circuit board surface-electrode ion trap. We then characterize the trap by measuring the secular frequencies and comparing them to a three-dimensional simulation of the trap, and by measuring the stray electric fields along two of the trap’s principal axes. Cancelling these fields by applying additional voltages enables a hundredfold increase in the trap lifetime to greater than ten minutes at a vacuum of 10a 9 torr. © 2007 The American Physical Society.
Full Text
Duke Authors
Cited Authors
- Brown, KR; Clark, RJ; Labaziewicz, J; Richerme, P; Leibrandt, DR; Chuang, IL
Published Date
- January 30, 2007
Published In
Volume / Issue
- 75 / 1
Electronic International Standard Serial Number (EISSN)
- 1094-1622
International Standard Serial Number (ISSN)
- 1050-2947
Digital Object Identifier (DOI)
- 10.1103/PhysRevA.75.015401
Citation Source
- Scopus