Laser ablation loading of a surface-electrode ion trap

Journal Article (Journal Article)

We demonstrate loading of Sr+88 ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 4 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful (500 meV). © 2007 The American Physical Society.

Full Text

Duke Authors

Cited Authors

  • Leibrandt, DR; Clark, RJ; Labaziewicz, J; Antohi, P; Bakr, W; Brown, KR; Chuang, IL

Published Date

  • November 8, 2007

Published In

Volume / Issue

  • 76 / 5

Electronic International Standard Serial Number (EISSN)

  • 1094-1622

International Standard Serial Number (ISSN)

  • 1050-2947

Digital Object Identifier (DOI)

  • 10.1103/PhysRevA.76.055403

Citation Source

  • Scopus