Characterization of an active metasurface using terahertz ellipsometry


Journal Article

© 2017 Author(s). Switchable metasurfaces fabricated on a doped epi-layer have become an important platform for developing techniques to control terahertz (THz) radiation, as a DC bias can modulate the transmission characteristics of the metasurface. To model and understand this performance in new device configurations accurately, a quantitative understanding of the bias-dependent surface characteristics is required. We perform THz variable angle spectroscopic ellipsometry on a switchable metasurface as a function of DC bias. By comparing these data with numerical simulations, we extract a model for the response of the metasurface at any bias value. Using this model, we predict a giant bias-induced phase modulation in a guided wave configuration. These predictions are in qualitative agreement with our measurements, offering a route to efficient modulation of THz signals.

Full Text

Duke Authors

Cited Authors

  • Karl, N; Heimbeck, MS; Everitt, HO; Chen, HT; Taylor, AJ; Brener, I; Benz, A; Reno, JL; Mendis, R; Mittleman, DM

Published Date

  • November 6, 2017

Published In

Volume / Issue

  • 111 / 19

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.5004194

Citation Source

  • Scopus