Measurement of AlxGa1-xN Refractive Indices

Published

Journal Article

Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic AlxGa1-xN epitaxial layers with 0 ≤ x ≤ 1.0 throughout the visible wavelength region 457 nm < λ < 800 nm. The dispersion, measured by a prism coupling waveguide technique is found to be well described by a first-order Sellmeier dispersion formula parameterized as functions of x and λ.

Full Text

Duke Authors

Cited Authors

  • Webb-Wood, G; Özgür, U; Everitt, HO; Yun, F; Morkoç, H

Published Date

  • November 1, 2001

Published In

Volume / Issue

  • 188 / 2

Start / End Page

  • 793 - 797

International Standard Serial Number (ISSN)

  • 0031-8965

Digital Object Identifier (DOI)

  • 10.1002/1521-396X(200112)188:2<793::AID-PSSA793>3.0.CO;2-S

Citation Source

  • Scopus