A sub-sampled approach to extremely low-dose STEM

Published

Journal Article

© 2018 Author(s). The inpainting of deliberately and randomly sub-sampled images offers a potential means to image specimens at a high resolution and under extremely low-dose conditions (≤1 e-/Å2) using a scanning transmission electron microscope. We show that deliberate sub-sampling acquires images at least an order of magnitude faster than conventional low-dose methods for an equivalent electron dose. More importantly, when adaptive sub-sampling is implemented to acquire the images, there is a significant increase in the resolution and sensitivity which accompanies the increase in imaging speed. We demonstrate the potential of this method for beam sensitive materials and in-situ observations by experimentally imaging the node distribution in a metal-organic framework.

Full Text

Duke Authors

Cited Authors

  • Stevens, A; Luzi, L; Yang, H; Kovarik, L; Mehdi, BL; Liyu, A; Gehm, ME; Browning, ND

Published Date

  • January 22, 2018

Published In

Volume / Issue

  • 112 / 4

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.5016192

Citation Source

  • Scopus