Semi-inclusive studies of semileptonic Bs decays at Belle

Journal Article (Journal Article)

We present an analysis of the semi-inclusive decays Bs→Ds-Xℓ+ν and Bs→Ds∗-Xℓ+ν, where X denotes a final state that may consist of additional hadrons or photons and ℓ is an electron or muon. The studied Bs decays are contained in the 121.4fb-1 Υ(5S) data sample collected by the Belle detector at the KEKB asymmetric-energy e+e- collider. The branching fractions of the decays are measured to be B(Bs→Ds-Xℓ+ν)=[8.2±0.2(stat)±0.6(syst)±1.4(ext)]% and B(Bs→Ds∗-Xℓ+ν)=[5.4±0.4(stat)±0.4(syst)±0.9(ext)]%, where the first two uncertainties are statistical and systematic and the last is due to external parameters. The measurement also provides an estimate of the Bs(∗)B¯s(∗) production cross section, σ(e+e-→Bs(∗)B¯s(∗))=[53.8±1.4(stat)±4.0(syst)±3.4(ext)]pb, at the center-of-mass energy s=10.86GeV.

Full Text

Duke Authors

Cited Authors

  • Oswald, C; Urquijo, P; Dingfelder, J; Abdesselam, A; Adachi, I; Aihara, H; Al Said, S; Asner, DM; Aushev, T; Ayad, R; Babu, V; Badhrees, I; Bakich, AM; Bhardwaj, V; Bobrov, A; Bonvicini, G; Bozek, A; Bračko, M; Browder, TE; Červenkov, D; Chang, MC; Chekelian, V; Chen, A; Cheon, BG; Chilikin, K; Cho, K; Chobanova, V; Choi, Y; Cinabro, D; Dalseno, J; DoleŽal, Z; Drásal, Z; Drutskoy, A; Dutta, D; Eidelman, S; Farhat, H; Fast, JE; Ferber, T; Frost, O; Fulsom, BG; Gaur, V; Gabyshev, N; Ganguly, S; Garmash, A; Getzkow, D; Gillard, R; Glattauer, R; Goh, YM; Goldenzweig, P; Golob, B; Grzymkowska, O; Hara, T; Hasenbusch, J; Hayasaka, K; Hayashii, H; He, XH; Hou, WS; Huschle, M; Hyun, HJ; Iijima, T; Ishikawa, A; Itoh, R; Iwasaki, Y; Jaegle, I; Julius, T; Kang, KH; Kapusta, P; Kato, E; Kawasaki, T; Kiesling, C; Kim, DY; Kim, JB; Kim, JH; Kim, KT; Kim, MJ; Kim, SH; Kim, YJ; Kinoshita, K; Ko, BR; Kodyš, P; Korpar, S; KriŽan, P; Krokovny, P; Kuhr, T; Kumita, T; Kwon, YJ; Lange, JS; Lee, DH; Lee, IS; Li, Y; Li Gioi, L; Libby, J; Liventsev, D; Lukin, P; Matvienko, D; Miyata, H; Mizuk, R; Mohanty, GB; Moll, A; Moon, HK

Published Date

  • October 22, 2015

Published In

Volume / Issue

  • 92 / 7

Electronic International Standard Serial Number (EISSN)

  • 1550-2368

International Standard Serial Number (ISSN)

  • 1550-7998

Digital Object Identifier (DOI)

  • 10.1103/PhysRevD.92.072013

Citation Source

  • Scopus