Atmospheric neutrino oscillation analysis with external constraints in Super-Kamiokande I-IV
© 2018 authors. Published by the American Physical Society. Published by the American Physical Society under the terms of the »https://creativecommons.org/licenses/by/4.0/» Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI. Funded by SCOAP 3 . An analysis of atmospheric neutrino data from all four run periods of Super-Kamiokande optimized for sensitivity to the neutrino mass hierarchy is presented. Confidence intervals for Δm322, sin2θ23, sin2θ13 and δCP are presented for normal neutrino mass hierarchy and inverted neutrino mass hierarchy hypotheses, based on atmospheric neutrino data alone. Additional constraints from reactor data on θ13 and from published binned T2K data on muon neutrino disappearance and electron neutrino appearance are added to the atmospheric neutrino fit to give enhanced constraints on the above parameters. Over the range of parameters allowed at 90% confidence level, the normal mass hierarchy is favored by between 91.9% and 94.5% based on the combined Super-Kamiokande plus T2K result.
Abe, K; Bronner, C; Haga, Y; Hayato, Y; Ikeda, M; Iyogi, K; Kameda, J; Kato, Y; Kishimoto, Y; Marti, L; Miura, M; Moriyama, S; Nakahata, M; Nakajima, T; Nakano, Y; Nakayama, S; Okajima, Y; Orii, A; Pronost, G; Sekiya, H; Shiozawa, M; Sonoda, Y; Takeda, A; Takenaka, A; Tanaka, H; Tasaka, S; Tomura, T; Akutsu, R; Irvine, T; Kajita, T; Kametani, I; Kaneyuki, K; Nishimura, Y; Okumura, K; Richard, E; Tsui, KM; Labarga, L; Fernandez, P; Blaszczyk, FDM; Gustafson, J; Kachulis, C; Kearns, E; Raaf, JL; Stone, JL; Sulak, LR; Berkman, S; Tobayama, S; Goldhaber, M; Carminati, G; Elnimr, M; Kropp, WR; Mine, S; Locke, S; Renshaw, A; Smy, MB; Sobel, HW; Takhistov, V; Weatherly, P; Ganezer, KS; Hartfiel, BL; Hill, J; Hong, N; Kim, JY; Lim, IT; Park, RG; Akiri, T; Himmel, A; Li, Z; O'Sullivan, E; Scholberg, K; Walter, CW; Wongjirad, T; Ishizuka, T; Nakamura, T; Jang, JS; Choi, K; Learned, JG; Matsuno, S; Smith, SN; Amey, J; Litchfield, RP; Ma, WY; Uchida, Y; Wascko, MO; Cao, S; Friend, M; Hasegawa, T; Ishida, T; Ishii, T; Kobayashi, T; Nakadaira, T; Nakamura, K; Oyama, Y; Sakashita, K; Sekiguchi, T; Tsukamoto, T; Hasegawa, M; Suzuki, AT; Takeuchi, Y
Volume / Issue
Electronic International Standard Serial Number (EISSN)
International Standard Serial Number (ISSN)
Digital Object Identifier (DOI)