Dual-energy computed tomography (DECT) offers several advantages over conventional single-energy CT. These advantages include improved image quality, beam hardening correction, and metal artifact reduction. Additionally, DECT allows derivation of quantitative information through material decomposition analysis. Although newer third-generation rapid-kilovolt switching and dual-source DECT scanners have significantly improved in image quality and workflow compared with initial iterations and early scanners, sources of potential image quality degradation can exist secondary to the inherent capabilities in which the image acquisition occurs.