Erratum: The impact of low energy proton damage on the operational characteristics of EPIC-MOS CCDs (Nuclear Instruments and Methods in Physics Research B (2003) 207 (175-185) DOI:10.1016/S0168-583X(03)008832.2)

Published

Journal Article

Full Text

Duke Authors

Cited Authors

  • Ambrosi, MR; Smith, DR; Abbey, AF; Hutchinson, IB; Kendziorra, E; Short, A; Holland, A; Turner, MJL; Wells, A

Published Date

  • February 1, 2005

Published In

Volume / Issue

  • 229 / 1

Start / End Page

  • 159 -

International Standard Serial Number (ISSN)

  • 0168-583X

Digital Object Identifier (DOI)

  • 10.1016/j.nimb.2004.11.027

Citation Source

  • Scopus