Effect of Applanation Tonometry on Keratometry Measurements Obtained with IOLMaster and Galilei Dual-Scheimpflug Analyzer

Published

Conference Paper

Full Text

Cited Authors

  • Sambhara, D; Hill, C; Hart, L; Chen, J; Scott, IU; Pantanelli, S

Published Date

  • September 1, 2016

Published In

Volume / Issue

  • 57 / 12

Published By

Pages

  • 2

Electronic International Standard Serial Number (EISSN)

  • 1552-5783

International Standard Serial Number (ISSN)

  • 0146-0404

Conference Name

  • Annual Meeting of the Association-for-Research-in-Vision-and-Ophthalmology (ARVO)

Conference Location

  • Seattle, WA

Conference Start Date

  • May 1, 2016

Conference End Date

  • May 5, 2016