Proton damage in the E2V swept charge device


Journal Article

The swept charge device has been developed using CCD technology to perform photon counting X-ray spectroscopy in the 0.5-10keV band as an alternative to silicon PIN and drift diode detectors. The key benefits of the detector are large area, combined with reduced electrical interconnects, with X-ray performance obtained using modest cooling to around -20°C. Here we test the technology for its suitability for space use where solar protons degrade the CTI of the detector leading to a degradation in its resolution as a spectrometer. We report on the irradiation experiments conducted and discuss changes in leakage current and energy resolution in the detector. © 2003 Elsevier B.V. All rights reserved.

Full Text

Duke Authors

Cited Authors

  • Holland, AD; Hutchinson, IB; Smith, DR; Pool, P

Published Date

  • April 1, 2004

Published In

Volume / Issue

  • 521 / 2-3

Start / End Page

  • 393 - 398

International Standard Serial Number (ISSN)

  • 0168-9002

Digital Object Identifier (DOI)

  • 10.1016/j.nima.2003.11.041

Citation Source

  • Scopus