How suitable is LCA for nanotechnology assessment? Overview of current methodological pitfalls and potential solutions: 65th LCA Discussion Forum, Swiss Federal Institute of Technology, Zürich, May 24, 2017

Published

Conference Paper

Full Text

Duke Authors

Cited Authors

  • Beloin-Saint-Pierre, D; Turner, DA; Salieri, B; Haarman, A; Hischier, R

Published Date

  • January 1, 2018

Published In

Volume / Issue

  • 23 / 1

Start / End Page

  • 191 - 196

Electronic International Standard Serial Number (EISSN)

  • 1614-7502

International Standard Serial Number (ISSN)

  • 0948-3349

Digital Object Identifier (DOI)

  • 10.1007/s11367-017-1399-3

Citation Source

  • Scopus