The role of texturing in X-ray diffraction tomography

Published

Conference Paper

© Copyright 2018 SPIE. Concealed threat detection is a challenging task that requires a high degree of material specificity. X-ray diffraction tomography (XRDT) offers a solution to the problem, but may at times be too sensitive to the details and history of a given sample. One example of this effect arises in the dependence of the measured scatter signal to the orientation of the sample relative to the beam, which we refer to generally as texturing. To better understand texturing in real world materials and imaging scenarios, we develop two experimental systems for measuring scatter and create databases of the resulting scatter form factors over a range of energies and angles. We then use this data to develop a simulation tool to model XRDT systems in the presence of textured materials and analyze the results. While texturing introduces complications to accurate imaging of an object, we find that choices in the measurement strategy can mitigate these effects and improve performance.

Full Text

Duke Authors

Cited Authors

  • Greenberg, JA; MacGibbon, C; Hazineh, D; Keohane, B; Wolter, S

Published Date

  • January 1, 2018

Published In

Volume / Issue

  • 10632 /

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

International Standard Serial Number (ISSN)

  • 0277-786X

International Standard Book Number 13 (ISBN-13)

  • 9781510617759

Digital Object Identifier (DOI)

  • 10.1117/12.2303620

Citation Source

  • Scopus