Terahertz field detector based on electron emission

Published

Conference Paper

© 2015 IEEE. This paper reports the electric field induced electron emission across the capacitive gap in a metamaterial structure under intense terahertz (THz) pulses. The gold metamaterial fabricated on a silicon nitride thin film can enhance the electric field greatly around the resonance frequency, resulting in THz field induced electron emission across the capacitive gap in the metamaterial structure when the incident electric field is > 60kV/cm. The emission current is measured experimentally and shows dependency on the strength of the incident field strength, which can be used as a THz detector.

Full Text

Cited Authors

  • Zhao, X; Zhang, J; Fan, K; Seren, HR; Averitt, RD; Zhang, X

Published Date

  • August 5, 2015

Published In

  • 2015 Transducers 2015 18th International Conference on Solid State Sensors, Actuators and Microsystems, Transducers 2015

Start / End Page

  • 2085 - 2088

International Standard Book Number 13 (ISBN-13)

  • 9781479989553

Digital Object Identifier (DOI)

  • 10.1109/TRANSDUCERS.2015.7181368

Citation Source

  • Scopus