Plano-eucentric photometry system for micro-display metrology

Conference Paper

We describe a unique micro-display metrology system in which the stage can be rotated arbitrarily and the area of interest does not leave the field of view. Similarly, the sample can be tilted up to 60 degrees and the area of interest stays continuously in focus. The mechanism operates instantaneously and does not depend on computers or motors to achieve correct centering. This capability facilitates the rapid measurement of micro-display characteristics over a wide range of angles. © 2005 SID.

Full Text

Duke Authors

Cited Authors

  • Lamvik, M; Grego, S

Published Date

  • December 1, 2005

Published In

Volume / Issue

  • 36 / 1

Start / End Page

  • 542 - 545

International Standard Serial Number (ISSN)

  • 0097-966X

Digital Object Identifier (DOI)

  • 10.1889/1.2036495

Citation Source

  • Scopus