Social Rejection and Suicidal Ideation and Attempts among Adolescents Following Hospitalization: a Prospective Study.

Journal Article (Journal Article)

Despite research indicating that stressful life events are associated with subsequent suicidal ideation (SI) and behavior, there is a lack of clarity regarding whether specific types of life events are differentially related to SI and attempts. The current prospective study examines whether social rejection related life events are proximally related to SI and suicide attempts in a clinically acute sample of adolescents. Adolescents aged 12 to 18 (n = 219) were followed for 6 months after discharge from inpatient hospitalization. A contextual threat interview of stressful life events between index admission and 6-month follow-up was administered. Participants were also assessed for current SI and suicide attempts at baseline and 6-month follow-up. Results from a multiple linear regression model indicated a significant prospective association between number of social rejection stressors and SI, even after controlling for baseline depressive symptoms, SI at study entry, gender, age, and number of non-social rejections stressors. An Anderson-Gill recurrent events model was conducted to examine the relationship between SR stressors and suicide attempts. Results demonstrated that the 31 days following a major social rejection stressor were associated with heightened risk for prospective suicide attempts. However, social rejection stressors were not more strongly related to risk for suicide attempt than non-social rejection stressors. These findings help clarify the role of social rejection as a precipitant of suicidal crises and have potential to inform more accurate, targeted risk assessment.

Full Text

Duke Authors

Cited Authors

  • Cheek, SM; Goldston, DB; Erkanli, A; Massing-Schaffer, M; Liu, RT

Published Date

  • January 2020

Published In

Volume / Issue

  • 48 / 1

Start / End Page

  • 123 - 133

PubMed ID

  • 31440932

Pubmed Central ID

  • PMC7025631

Electronic International Standard Serial Number (EISSN)

  • 1573-2835

Digital Object Identifier (DOI)

  • 10.1007/s10802-019-00580-z


  • eng

Conference Location

  • United States