Identification and correlation of microstructural defects with flux pinning in Ni‐doped melt textured YBa2 Cu3 O7−δ

Journal Article

Full Text

Duke Authors

Cited Authors

  • Pavate, V; Williams, LB; Kvam, EP; Kozlowski, G; Endres, W; Oberly, CE

Published Date

  • July 11, 1994

Published In

Volume / Issue

  • 65 / 2

Start / End Page

  • 246 - 248

Published By

Electronic International Standard Serial Number (EISSN)

  • 1077-3118

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.112615

Language

  • en