Identification and correlation of microstructural defects with flux pinning in Ni‐doped melt textured YBa2 Cu3 O7−δ
Journal Article
Full Text
Duke Authors
Cited Authors
- Pavate, V; Williams, LB; Kvam, EP; Kozlowski, G; Endres, W; Oberly, CE
Published Date
- July 11, 1994
Published In
Volume / Issue
- 65 / 2
Start / End Page
- 246 - 248
Published By
Electronic International Standard Serial Number (EISSN)
- 1077-3118
International Standard Serial Number (ISSN)
- 0003-6951
Digital Object Identifier (DOI)
- 10.1063/1.112615
Language
- en