Caria, G., Urquijo, P., Adachi, I., Aihara, H., Al Said, S., Asner, D. M., … Belle Collaboration. (2020). Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method. Physical Review Letters, 124(16), 161803. https://doi.org/10.1103/physrevlett.124.161803

Caria, G., P. Urquijo, I. Adachi, H. Aihara, S. Al Said, D. M. Asner, H. Atmacan, et al. “Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method.” Physical Review Letters 124, no. 16 (April 2020): 161803. https://doi.org/10.1103/physrevlett.124.161803.

Caria G, Urquijo P, Adachi I, Aihara H, Al Said S, Asner DM, et al. Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method. Physical review letters. 2020 Apr;124(16):161803.

Caria, G., et al. “Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method.” Physical Review Letters, vol. 124, no. 16, Apr. 2020, p. 161803. Epmc, doi:10.1103/physrevlett.124.161803.

Caria G, Urquijo P, Adachi I, Aihara H, Al Said S, Asner DM, Atmacan H, Aushev T, Babu V, Badhrees I, Bahinipati S, Bakich AM, Behera P, Beleño C, Bennett J, Bhuyan B, Bilka T, Biswal J, Bozek A, Bračko M, Browder TE, Campajola M, Červenkov D, Chang P, Cheaib R, Chekelian V, Chen A, Cheon BG, Chilikin K, Cho HE, Cho K, Choi Y, Choudhury S, Cinabro D, Cunliffe S, Dash N, De Nardo G, Di Capua F, Di Carlo S, Doležal Z, Dong TV, Eidelman S, Epifanov D, Fast JE, Ferber T, Ferlewicz D, Fulsom BG, Garg R, Gaur V, Gabyshev N, Garmash A, Giri A, Goldenzweig P, Greenwald D, Grzymkowska O, Guan Y, Hartbrich O, Hayasaka K, Hayashii H, Higuchi T, Hou W-S, Hsu C-L, Iijima T, Inami K, Inguglia G, Ishikawa A, Itoh R, Iwasaki M, Iwasaki Y, Jacobs WW, Jeon HB, Jia S, Jin Y, Joffe D, Joo KK, Kaliyar AB, Kang KH, Karyan G, Kawasaki T, Kichimi H, Kim CH, Kim DY, Kim HJ, Kim KT, Kim SH, Kinoshita K, Kodyš P, Korpar S, Kotchetkov D, Križan P, Kroeger R, Krohn J-F, Krokovny P, Kuhr T, Kumar R, Kwon Y-J, Lange JS, Lee IS, Lee JK, Lee SC, Li LK, Li YB, Li Gioi L, Libby J, Lieret K, Liventsev D, Luo T, MacQueen C, Masuda M, Matsuda T, Matvienko D, Merola M, Metzner F, Miyabayashi K, Mohanty GB, Moon TJ, Mori T, Mussa R, Nakamura KR, Nakao M, Nath KJ, Nayak M, Nisar NK, Nishida S, Nishimura K, Ogawa K, Ono H, Onuki Y, Oskin P, Pakhlov P, Pakhlova G, Pal B, Pang T, Park H, Park S-H, Patra S, Paul S, Pedlar TK, Pestotnik R, Piilonen LE, Popov V, Prencipe E, Prim MT, Rabusov A, Resmi PK, Ritter M, Rozanska M, Russo G, Sahoo D, Sakai Y, Sandilya S, Santelj L, Sanuki T, Savinov V, Schneider O, Schnell G, Schueler J, Schwanda C, Schwartz AJ, Seino Y, Senyo K, Sevior ME, Shebalin V, Shiu J-G, Shwartz B, Simon F, Sokolov A, Solovieva E, Starič M, Stottler ZS, Sumiyoshi T, Sutcliffe W, Takizawa M, Tamponi U, Tanida K, Tenchini F, Trabelsi K, Uchida M, Uglov T, Uno S, Usov Y, Vahsen SE, Van Tonder R, Varner G, Varvell KE, Vossen A, Waheed E, Wang B, Wang CH, Wang M-Z, Wang P, Wang XL, Watanuki S, Wiechczynski J, Won E, Yamamoto H, Yang SB, Ye H, Yin JH, Yuan CZ, Zhang ZP, Zhilich V, Zhukova V, Zhulanov V, Belle Collaboration. Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method. Physical review letters. 2020 Apr;124(16):161803.